Centre for Nanoscience and Nanotechnology
Bharathidasan University, Tiruchirappalli, India
Extendable Research Facilities

Atomic Force Microscope (AFM)
AFM (Agilent 5500) can be used to examine the surface morphology of the materials (such as conducting, non-conducting, polymer, composites biological sample etc.,) with atomic resolution. The particle size and roughness of the sample can also be analyzed. It also has several additional modes such as Magnetic Force Microscopy (MFM), Current Sensing Atomic Force Microscopy (CSAFM), etc.

Field Emission Scanning Electron Microscope (FESEM)
FESEM (Carl Zeiss) can be used to image all materials (conducting and non-conducting) with very high-resolution (approximately 1.5 nm). The FESEM system is also equipped with an Oxford Instruments, UK make energy dispersive X-ray analysis (EDAX) system for the compositional analysis including mapping of the material to be examined. Elements with atomic number greater than 5 can be detected by the high-resolution TE cooled detector.

Room/low temperature Photoluminescence
The photoluminescence spectrometer (HORIBA Jobin Yvon) is used to probe the optical properties, such as band gap, recombination mechanisms and defect detection, of the materials. High performance thermoelectric cooled detector can detect a better spectrum by allowing good signal to noise ratio and long integration time. Specifications

Excitation source : He-Cd Laser (λ =325 nm)
Detection range : 350-900 nm
Temperature range : 10-300 K

Zetasizer Nano S90
The Zetasizer Nano S90 can be used in particle characterization by combining accurate, reliable and repeatable measurement of zeta potential, particle size and molecular weight.

Size measurement
Size range maximum (diameter) 0.3nm - 5 microns
Minimum sample volume 20μL

Forms Download

    Rules and Charges for utilizing the Nano User Facility (NUF)

    Nano User Facility form

    Nano User Facility form-I

    Nanouser Faciity Form-II DLS