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Department of Physics
Facilities
| Name of the equipment | Make/Model and year | HPC Clusters with computational tools | Super Micro, HP & IBM |
|---|---|
| Physical Property Measurement System - VSM @ 2 K, 9 T, 9 GPa | Quantum Design, USA (2008) |
| Field Emission Scanning Electron microscopy (FESEM) with EDS | Carl Zeiss, Sigma (2009) |
| Atomic Force Microscopy (AFM) | Agilent, 5500 (2008) |
| High Resolution Raman Spectrometer | InVia, Renishaw, UK (2018) |
| Power X-ray Diffraction (XRD) | Rigagu, Ultima III Max, Japan (2017) |
| Q-Switched Nd:YAG laser (1064 nm, 450mJ, 10 ns) | Newport, USA (2008) |
| HALL system | Ecopia, South Korea (2008) |
| DLS-Zeta potential | ZS 90 , Malvern UK (2012) |
| Particle Size Analyzer | Horiba (2018) |
| Spectrofluorometer with time resolved single photon counting | FluoroMax-C Horiba (2019) |
| Solar Simulator with I V | Oriel-Newport, US (2015) |
| Low Temperature Photoluminescence @ 325 nm | Horiba, USA (2009) |
| I V setup with probe station | Keitheley 2400 (USA) |
| Gas Chromatography - GC | Shimadzu GC 2014, Japan (2017) |
| Potentiostat / Cyclic Voltametry | Biologic SP 150 (2017) |
| Rapid Thermal Annealing (RTA) furnace | Labtherm India (2017) |
| Xenon Lamp Source- 300 W | Oriel OPS-A500 (2017) |
| CCR-TI (4 – 800 K) | - |
| Chemical Vapour Deposition | MTI XTL/MKS, USA (2010) |
| Thermal/Electron Beam evaporation | HHV, 2003 |
| DC/RF magnetron sputtering | HHV, 2009 |
| Organic Molecular Evaporation Unit | HHV, 2018 |
| Electron Beam evaporation | HHV, 2018 |
| Thermal evaporation unit | VT Vacuum (2010) |
| Crystal Growth CZ Puller | Vi Micronics, Indigenous (2009) |
| VGF crystal Growth system | Trend Electric & Co, Indigenous (2009) |
| Bridgman crystal growth unit | Vi Micronics, Indigenous (2009) |
| Planetary Ball milling | QM-3SP04 (2010) |
| 100Ton (LYXN, Lawrence & Mayo) and 20 Ton, hydraulic press | Riken Kiki, Japan |
| Semi-automatic Hydraulic Pressure | Kimaya-30 TON (2010) |
| CNC Lathe - 5 Axis | Tutor, ACE, Bangalore |
| Spin coater | Apex Instruments (2009) |
| Source Measure Unit | B2901A, Aglient, USA |
| SEM Sputter coater | D1153, HHV, Bangalore |
| LCR Meter | IM3536, Hioki, Japan (2017) |
| Langmuir-Blodgett Thin film Unit | Apex instruments (2015) |