Extendable Research Facility

1. Atomic Force Microscope (AFM)
2. Field Emission Scanning Electron Microscope (FESEM)
3. Room/low temperature Photoluminescence
4. Zetasizer Nano S90
5. Micro-Raman Spectroscopy
6. Planetary Ball Milling
7. Tubular Furnace- Annealing

1. Atomic Force Microscope (AFM)

AFM (Agilent 5500) can be used to examine the surface morphology of the materials (such as conducting, non-conducting, polymer, composites, biological samples etc.,) with atomic resolution. The particle size and roughness of the sample can also be analyzed. It also has several additional modes, such as Magnetic Force Microscopy (MFM), Current Sensing Atomic Force Microscopy (CSAFM), etc.

2. Field Emission Scanning Electron Microscope (FESEM)

FESEM (Carl Zeiss) can be used to image all materials (conducting and non-conducting) with very highresolution (approximately 1.5 nm). The FESEM system is also equipped with an Oxford Instruments, UK-made energy dispersive X-ray analysis (EDX) system for compositional analysis, including mapping of the material to be examined. Elements with atomic numbers greater than 5 can be detected by the high-resolution TE cooled detector.

3. Room/low temperature Photoluminescence

The photoluminescence spectrometer (HORIBA Jobin Yvon) is used to probe the optical properties, such as band gap, recombination mechanisms and defect detection, of the materials. High performance thermoelectric cooled detector can detect a better spectrum by allowing a good signal-to-noise ratio and long integration time.
Specifications
Excitation source : He-Cd Laser (λ =325 nm)
Detection range : 350-900 nm
Temperature range : 10-300 K

4. Zetasizer Nano S90

The Zetasizer Nano S90 can be used in particle characterization by combining accurate, reliable and repeatable measurement of zeta potential, particle size and molecular weight.
Size Measurement
Size range maximum (diameter) 0.3nm - 5 microns
Minimum sample volume 2

5. Raman Spectrophotometer

The Renishaw InVia Raman Spectrophotometer is a high-resolution, laboratory-grade instrumentused for detailed structural analysis in the micrometer range, including the study of molecular structures, vibrational properties, and the identification of materials.
Specifications
Excitation source :DPSS Laser :532nm; He-Ne Laser :633 nm
Raman shift range :50-3000cm^-1

6. Planetary Ball Mill

The Planetary Ball Mill QM-3SP04 is designed for mixing, fine grinding, new product development, and small-scale production of high-tech materials. It is widely used in fields such as geology, mining, metallurgy, electronics, semiconductors, materials science, construction materials, ceramics, chemical engineering, light industry, medicine, and environmental protection, including the preparation of nanomaterials.
Specifications
Drive Mode: Gear drive and belt drive
Operation Mode: Two or four grinding tanks working together
Maximum Loading Capacity: 2/3 of the capacity of the milling tank
Feeding Granularity: Soil material ≤ 10mm, other materials ≤ 3mm or micrometer range
Output Granularity: 0.1um and even nm range can be achieved
Rotational speed ratio (revolution: Rotation): 1: 2
Rotation Speed: 0.4L: 0~600 RPM
Speed Regulation Mode: automatic clock / anti-clockwise
Max. Continuous operating time (full-load): 72 hours

7. Tubular Furnace- Annealing

Tubular furnaces are used for annealing solid and powdered materials in research and industrial development of advanced materials for materials science, ceramics, electronics, semiconductors, and nanomaterials. The samples can be annealed at temperatures up to 1200 C under controlled atmospheres, such as nitrogen, air and vacuum.

Rules and Charges for utilizing the Nano User Facility

1. Nano User Facility (NUF) services are provided on a chargeable basis. Payment should be made in advance by Demand Draft (DD) in favor of "The Registrar, Bharathidasan University," payable at Tiruchirappalli.
2. It is requested to bring the signed requisition form (enclosed).
3. For a better analysis, the basic details about the sample should be provided in a separatesheet.
4. For AFM & FESEM measurements, only 4 micrographs per sample will be given.
5. Bring ONLY a fresh CD/PEN drive for the collection of results. Used CDs or PEN drives are not allowed.

Charges per Sample (Amount in )

•  Download the Form 1 for AFM, FESEM & PL
•  Download the Form 2 for DLS
•  Download the NUS Application Form