Extendable Research Facility

1. Atomic Force Microscope (AFM)

AFM (Agilent 5500) can be used to examine the surface morphology of the materials (such as conducting, non-conducting, polymer, composites biological sample etc.,) with atomic resolution. The particle size and roughness of the sample can also be analyzed. It also has several additional modes such as Magnetic Force Microscopy (MFM), Current Sensing Atomic Force Microscopy (CSAFM), etc.

2. Field Emission Scanning Electron Microscope (FESEM)

FESEM (Carl Zeiss) can be used to image all materials (conducting and non-conducting) with very high-resolution (approximately 1.5 nm). The FESEM system is also equipped with an Oxford Instruments, UK make energy dispersive X-ray analysis (EDAX) system for the compositional analysis including mapping of the material to be examined. Elements with atomic number greater than 5 can be detected by the high-resolution TE cooled detector.

3. Room/low temperature Photoluminescence

The photoluminescence spectrometer (HORIBA Jobin Yvon) is used to probe the optical properties, such as band gap, recombination mechanisms and defect detection, of the materials. High performance thermoelectric cooled detector can detect a better spectrum by allowing good signal to noise ratio and long integration time.
Specifications
Excitation source : He-Cd Laser (λ =325 nm)
Detection range : 350-900 nm
Temperature range : 10-300 K

4. Zetasizer Nano S90

The Zetasizer Nano S90 can be used in particle characterization by combining accurate, reliable and repeatable measurement of zeta potential, particle size and molecular weight.
Size measurement
Size range maximum (diameter) 0.3nm - 5 microns
Minimum sample volume 20μL

Rules and Charges for utilizing the Nano User Facility

1. Nano User Facility (NUF) services are provided on the basis of charges. Payment has to be made in advance by Demand Draft (DD) in favour of "The Registrar, Bharathidasan University" payable at Tiruchirappalli.
2. It is requested to bring the signed requisition form (enclosed).
3. For a better analysis, the basic details about the sample should be provided in a separate sheet.
4. For AFM & FESEM measurements, only 3 – 4 micrographs per sample will be given.
5. FESEM for non-conducting samples, gold coating is recommended.
6. Bring ONLY FRESH CD for the collection of results. Used CDs or PEN drives are not allowed.

Charges per Sample

 Download the Form 1 for AFM, FESEM & PL
 Download the form 2 for DLS

* No analysis/reports will be made.
* Turnaround time for measurements: 3-5days working days.
No refund of the payment made in any case.